Site Components

InSight Blog

Hlavní stránka/ Blog (Old)

Olympus InSight Blog > Microscopy

Microscopy

Going Ballistic: Laser Scanning Confocal Microscopy Helps Identify Breech Face Markings

By Robert Bellinger - červenec 11, 2017

Using Image Analysis Software to Automatically Detect Particles in Cadmium Zinc Telluride

By Robert Bellinger - květen 16, 2017

The Increasing Importance of Technical Cleanliness

By Francesco Piscani - březen 30, 2017

The Trend Toward LED Illumination in Microscopy Applications

By Xin Yang - únor 23, 2017

A Turnkey Solution to Technical Cleanliness

By Jennifer Wrigley - leden 24, 2017

Digital Microscopy in QA/QC: Pushing the Limits of Inspection

By Robert Bellinger - prosinec 13, 2016

What can an imaging database do for you?

By Marc Silverstein - listopad 29, 2016

Under the Stereo Microscope

By Marc Silverstein - říjen 11, 2016

Subscribe to the InSight Blog

Submit your suggestion!

Authors

Portable Products Manager, Analytical Instruments

Olympus InSight Team

Olympus NDT - Applications Team

Michelle Wright

Marketing Specialist, Analytical Instruments

Product Applications Manager, Olympus Corporation of the Americas, Scientific Solutions Group

Applications Scientist

Vertical Market Leader, Natural Resources

Product Manager, RVI

Applications Engineering Manager

Marc Silverstein

Product Manager, Industrial Microscopes

Damien Blondel (Olympus OISE)

Environmental and Natural Resources Vertical Market Specialist

Francesco Piscani

Applications Specialist

XRD Scientist

Principal Geologist, Olympus International Mining Group

Robert Bellinger

Product Applications Manager, Industrial Microscopes

Product Marketing Specialist, Ultrasonic Flaw Detectors

Sales Engineer

Ghislain Morais

Product Leader, Eddy Current Product Line

Application Specialist

Global Business Development Manager, International Mining Group

Tommy Bourgelas

Product Manager, Eddy Current and Bond Testing product line

Dillon McDowell

Applications Scientist, Analytical Instruments

Associate Product Manager

Olympus RVI Applications Team

Jennifer Wrigley

Senior Product Manager, Scientific Solutions Group

Michael W. Hull

Applications Scientist

Charles Janecka

Sales Engineer, Remote Visual Inspection

Product Manager, Scanners and Inspection Solutions

Dianne Hillhouse

Business Development Manager, Inspection Services Market

Director, International Mining Group

Show all authors

Previous Posts

InSight Blog Sign-up

Division *

Společnost

Jméno *

Příjmení *

E-mail *

Země: *

PSČ *

I agree to the Terms of Use and acknowledge that I have read the Privacy Policy*

If you already have your personal ID enter it here:

Sorry, this page is not available in your country

Let us know what you're looking for by filling out the form below.

Kontaktujte nás

Zaregistrovat se pro odběr Newsletterů

Sorry, this page is not available in your country