The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light.
*This product is not available in all locations.

Measuring Image

Measuring even minute areas The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.

Principle of Eliminating Rear Surface Reflection

Reduces backside interference Accurate measurement of surface reflectivity can be performed without the costly steps that are typically needed to prevent rear surface reflection. Rear surface-reflected light is reduced by means of special optics that block out all out of focus light reflection similar to a confocal system. Whether your optical component is spherical, aspherical or flat the USPM-RU III does not require sample prep through anti-reflection treatments

Fast Results

Quick, highly repeatable measurements can be achieved in seconds using a flat filed grating, line sensor and high -speed spectrophotometry.

XY Chromaticity

X-Y Chromaticy Diagrams and L*A*B Measurement Object color can be measured based on spectrophotometric colorimetry determined from the prismatic reflectivity.

Software

Reflectivity graph image

Reflectivity text data image