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Archivo para 2017

Hidden Danger: Screening Garden Soil for High Levels of Lead

By Sam Habib - mayo 23, 2017

Using Image Analysis Software to Automatically Detect Particles in Cadmium Zinc Telluride

By Robert Bellinger - mayo 16, 2017

Don’t Let Broken Wind Towers Get You Down(time)

By Frank Lafleur - mayo 10, 2017

Out of the Office: Five Months on the Road with Marcus

By Marcus Lake - mayo 09, 2017

How to Get Comfortable Finding the Right Frequency on Your Bond Tester

By Tommy Bourgelas - abril 18, 2017

Decoration for the Dead: Using XRF to Test Pigment Color on Ancient Egyptian Sarcophagi

By Michelle Wright - abril 04, 2017

The Increasing Importance of Technical Cleanliness

By Francesco Piscani - marzo 30, 2017

Consumer Product Testing Using Vanta Handheld XRF

By Dillon McDowell - marzo 21, 2017

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Autores

Ted Shields

Portable Products Manager, Analytical Instruments

Olympus InSight Team

Olympus NDT - Applications Team

Michelle Wright

Marketing Specialist, Analytical Instruments

Hamish Rossell

Product Applications Manager, Olympus Corporation of the Americas, Scientific Solutions Group

Karen Paklin

Applications Scientist

Sam Habib

Vertical Market Leader, Natural Resources

Peter Faulkner

Frank Lafleur

Product Manager, RVI

Alex Thurston

Applications Engineering Manager

Marc Silverstein

Product Manager, Industrial Microscopes

Damien Blondel (Olympus OISE)

Environmental and Natural Resources Vertical Market Specialist

Francesco Piscani

Applications Specialist

Jose Brum

XRD Scientist

Aaron Baensch

Principal Geologist, Olympus International Mining Group

Robert Bellinger

Product Applications Manager, Industrial Microscopes

Calvin Jory

Product Marketing Specialist, Ultrasonic Flaw Detectors

Joel Drapeau

Jennifer Caban

Sales Engineer

Ghislain Morais

Product Leader, Eddy Current Product Line

Florin Turcu

Application Specialist

Marcus Lake

Global Business Development Manager, International Mining Group

Tommy Bourgelas

Product Manager, Eddy Current and Bond Testing product line

Dillon McDowell

Applications Scientist, Analytical Instruments

Xin Yang

Associate Product Manager

Olympus RVI Applications Team

Jennifer Wrigley

Senior Product Manager, Scientific Solutions Group

Michael W. Hull

Applications Scientist

Charles Janecka

Sales Engineer, Remote Visual Inspection

Simon Alain

Product Manager, Scanners and Inspection Solutions

Dianne Hillhouse

Business Development Manager, Inspection Services Market

Todd Houlahan

Director, International Mining Group

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