Confidence You Can See—Introducing the OmniScan™ X3 PAUT/TFM Flaw DetectorGet an overview, including a live demo, of the new OmniScan flaw detector’s innovative TFM imaging, improved phased array inspection, streamlined TOFD menu, and other enhancements. The session is approximately 30 minutes. Presenter: Tommy Bourgelas, Senior Product Manager—OmniScan Product Line Date: January 22, 2020
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The Basics of the Total Focusing Method (TFM)
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See how the AIM modeling tool and its Sensitivity Index feature show users which TFM wave sets and probe will be most effective for a given application.
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Presenter: Emilie Peloquin, Global Advanced Product Support Manager
Date: March 4, 2020
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Total Focusing Method (TFM) vs Phased Array (PAUT)—When to Use Each MethodKnow when to choose TFM over PAUT, and vice versa. This webinar will cover the advantages and limitations of each method for specific applications. Presenter:Stephan Couture, Global Advanced Product Support Specialist Date: March 25, 2020
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Ensuring Code Compliance While Using the Total Focusing Method
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Tommy Bourgelas, Senior Product Manager—OmniScan Product Line | |
Emilie Peloquin, Global Advanced Product Support Manager | |
Daly Souissi, Global Markets Manager | |
Stephan Couture, Global Advanced Product Support Specialist |
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