Hamish Rossell
Hamish Rossell
Product Applications Manager, Olympus Corporation of the Americas, Scientific Solutions Group
A member of the Olympus team since 2016, Hamish provides product and application support for Olympus industrial microscope systems throughout the Americas. He is an expert in inspection applications, image analysis, measurement, and reporting, as well as custom optical solutions, with an emphasis on technical cleanliness and semiconductor equipment.
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Breaking Down the Technical Cleanliness Workflow Part 6: Reviewing Results and Reporting
By Hamish Rossell -
13 November, 2018
From Macro to Micro: How Digital Microscopes are Changing Industrial Inspections
By Hamish Rossell -
2 October, 2018
Breaking Down the Technical Cleanliness Workflow Part 5: Reflective/Nonreflective Particle and Fiber Identification
By Hamish Rossell -
13 September, 2018
Flawless Finish? How Digital Microscopy is Transforming the Automotive Paint Shop
By Hamish Rossell -
15 August, 2018
Breaking Down the Technical Cleanliness Workflow Part 4: Contamination Level Calculation
By Hamish Rossell -
19 April, 2018
Breaking Down the Technical Cleanliness Workflow Part 3: Particle Size Classification and Particle Count Extrapolation and Normalization
By Hamish Rossell -
1 March, 2018
Breaking Down the Technical Cleanliness Workflow Part 2: Image Acquisition and Particle Measurement
By Hamish Rossell -
22 January, 2018
Breaking Down the Technical Cleanliness Workflow Part 1: Preparation
By Hamish Rossell -
18 December, 2017