Flexible Printed Circuit Boards
Background
The importance of microscopic inspection increases as package miniaturization and space-reduction technologies continue to enhance overall product performance in contemporary electronic devices. Clear observation of ruptured, polyimide-covered wiring is difficult, however, using conventional illumination methods.
Application
Mixing brightfield and darkfield illumination techniques provides inspectors with significantly-improved images for faster, more accurate results.
The Olympus solution
Mixed (brightfield and darkfield) illumination enables previously-unobservable sample views using conventional illumination methods. The Olympus BX53M industrial microscope allows users to conduct inspections using mixed illumination methodologies for clear visual confirmation of polyimide-covered PCB wiring. The observation method may be manually adjusted using a dial on the illuminator unit, allowing users to quickly switch between bright/darkfield, differential interference, and other frequently-used observation methods.
Brightfield illumination | Darkfield illumination |
MIX illumination
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