Capability Beyond the ConventionalUnlock the full potential of an automated semiconductor inspection with custom microscope hardware and software. |
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The MX63 and MX63L semiconductor microscope systems offer quality observations for up to 300 mm wafers, flat panel displays, printed circuit boards, and other large samples. These ergonomic and user-friendly systems feature a modular design for diverse applications. To streamline your inspection, the MX63 series can be customized with:
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Customize Your Semiconductor Microscope |
Full MotorizationDiscover our motorized X-Y stages and Z-axis for automated semiconductor inspection. |
Enhanced ImagingUse transmitted IR light for inspection through silicon samples, such as chip damage inspection and short circuit detection. |
Custom Sample HoldersChoose from a range of sample holders that can be customized for specific applications. |
Customized Software to Optimize Your Inspection WorkflowsMaximize all the advantages of a motorized stage with customized software solutions. Our PRECiV™ software can be customized for your specific workflow. |
For example, the Navigate on Wafer customized solution offers a multiposition measurement workflow. Watch the video to learn how this solution defines the wafer layout and navigates to various points on the wafer for imaging. |
Contact Us to Discuss Your Requirements |