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2015년 8월 25일

Olympus Introduces a Low-Profile Probe for the Magna-Mike Thickness Gage

Olympus, a world leader in nondestructive testing technologies, is pleased to introduce a new, low-profile probe for the Magna-Mike® Hall Effect thickness gage. This new probe is specifically designed to reach and fit into confined spaces with a clearance greater than 0.40 in. (10 mm). In addition, the probe features an articulating tip that allows the user to set the probe head at a precise angle to conform to the contours of the test material.

The probe (part number 86PR-3) can be used to measure the thickness of non-ferrous materials such as aluminum, titanium, plastics, composites and rubber with a maximum wall thickness of 0.160 in. (4.0 mm). Typical applications include tightly spaced curved turbine blades, plastic automotive parts, and any other areas that prevent access with a micrometer or ultrasonic transducer.

The Magna-Mike is a portable thickness gage that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Measurements are made when its magnetic probe is held or scanned on one side of the test material and a small target ball, wire, or disk is placed on the opposite side. The probe's Hall Effect sensor measures the distance between the probe tip and target, and measurements are instantly displayed on the instrument’s large color display.

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8월 25, 2015
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