홈/ 제품/ NDT 시스템 계측기/ QuickScan iX ECA/ Overview

Powerful Eddy Current Array Solution for In-Process Surface Inspection

The QuickScan iX ECA acquisition instrument is specifically designed for surface inspections in a material production environment. Its design meets the same reliable 24 V I/O industrial standards as the field proven QuickScan iX PA instrument. Up to eight probes can be connected per unit. Several acquisition units can be combined for more demanding configurations in terms of probes or speed.

QuickScan iX ECA Instrument

Build to Withstand Industrial Demands

The QuickScan iX ECA instrument is our latest generation of eddy current acquisition units for industrial inspection systems. The acquisition unit meets IP55 standards and easily integrates into industrial environments.

Automatic liftoff compensation

Up to

8

inputs per instrument

Expandable for High-Speed Inspection Needs

Up to eight probes can be connected per unit. Several acquisition units can be combined for more demanding configurations involving more probes or higher speed requirements.

Up to

40 kHZ

acquisition rate

From

50kHz to 2MHz

frequency range

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Overview