The MX63 and MX63L semiconductor microscope systems offer quality observations for up to 300 mm wafers, flat panel displays, printed circuit boards, and other large samples. These ergonomic and user-friendly systems feature a modular design for diverse applications.

To streamline your inspection, the MX63 series can be customized with:

• Large, motorized stage to inspect large wafers
• An array of wafer holders and sample fixtures
• Tailor-made software based on simple-to-use PRECiV™ software
• Adapters to enable transmitted IR inspection

Customized Software to Optimize Your Inspection Workflows

Maximize all the advantages of a motorized stage with customized software solutions. Our PRECiV™ software can be customized for your specific workflow.

For example, the Navigate on Wafer customized solution offers a multiposition measurement workflow. 

Watch the video to learn how this solution defines the wafer layout and navigates to various points on the wafer for imaging.