sierpień 07, 2013 Leading global researchers discuss the development of optical surface analysis and the advantages of areal surface metrology Olympus is pleased to present interview articles by three of the leading global thinkers on surface metrology and roughness analysis: Dr. Chris Brown from Worcester Polytechnic Institute in the United States, Dr. Richard Leach from the National Physical Laboratory (NPL) in the United Kingdom, and Dr. Kazuhisa Yanagi of Nagaoka University of Technology in Japan. Each article explores the development of areal surface metrology, the benefit of moving from line to areal measurements and how the latest generation of confocal optical microscopy is making this new measurement possible. Dr. Christopher Brown is a professor of mechanical engineering and the director of the Surface Metrology Lab at Worcester Polytechnic Institute. His article is titled “Surface Measurement & Manufacturing”. This article looks at challenges that have been overcome using optical measurement equipment, the advantage of areal measurements and the importance of worldwide measurement standards. Dr. Richard Leach is a principal research scientist with the National Physical Laboratory and a Fellow of the Institute of Physics and the Institute of Nanotechnology. His article is titled “Optical Instruments Defining the Evolution of Surface Texture Measurement in Manufacturing”. This article looks at the changes in surface texture measurement from the use of contact-type measurement systems to systems that derive their measurements from light such as interferometers and confocal microscopes. Dr. Kazuhisa Yanagi is a professor of faculty of engineering in the Department of Mechanical Engineering at Nagaoko University of Technology. His article is titled “Coming Age of Surface Metrology with Optical Instruments”. This article looks at the needs for more minute analysis of surface conditions, the move from mechanical contact to light measurement and the future of Areal roughness measurement. We hope you enjoy each of these articles. Olympus is fortunate to work such leading thinkers in Surface Metrology and we look forward to sharing their valuable insights with you today and in the future |