GageView | Olympus IMS

The GageView and GageView Pro Interface Programs are Windows-based applications that collect, create, manage, and print data from Olympus thickness gages and flaw detectors.

GageView is compatible with gage models 35DL, 35DLHP, and MG2-DL. It provides the following capabilities:

Creating Datasets and Surveys
Editing stored data such as thickness data
Viewing Dataset and Survey file information including thickness readings, waveform, gage setup values, and transducer setup values
Downloading and uploading thickness surveys to and from the Panametrics ultrasonic thickness gages
Exporting Surveys to spreadsheets and other programs
Collecting snapshot screens (graphical data sent by a thickness gage that duplicates the exact screen display)
Printing reports such as Thickness, Setup Table, Statistics, Color Grid, and others
Upgrading gage operating software

GageView Pro is compatible with flaw detector models Epoch 4, Epoch 4B, Epoch LT, Epoch 4 PLUS, and Epoch XT, as well as the gage models listed above. When used with flaw detectors, GageView Pro provides the following capabilities:

Exporting thickness or amplitude data saved on the Epoch to Excel, Word, or similar programs
Create, format, and manage test databases
Export real-time screen snapshots, including B-scans, to a PC or printer
Import and export setups between the Epoch and a PC
Set up inspection plan templates, including pre-loaded probe calibrations, IDs, and memos
Create a custom DGS probe library
Upgrade Epoch operating software

GageView™ Programs for Documentation and Data Transfer

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GageView™ Programs for Documentation and Data Transfer

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