New STM7 Measuring Microscope Efficiently Measures Various Component Shapes in Industrial Applications

Olympus Corporation (President: Hiroyuki Sasa) today announced the release by its Scientific Solutions Business of the STM7 measuring microscope for the efficient shape measurement of machined parts, semiconductors, electronic components, and other parts in industrial processes, with international sales*  to commence progressively from November 4, 2014.

Measuring microscopes are optical instruments that can be used for both non-contact shape measurement and as a metallurgical microscope. They are used for the efficient and non-contact measurement of samples in the manufacturing and assembly of a wide variety of parts. In addition to their traditional use for the measurement of machined parts, this also includes the growing number of semiconductor components used in mobile devices.

The new STM7 features a large square stage for holding samples on which parts with a variety of sizes and shapes can be placed for measurement at the same time. The microscope frame also has a highly rigid and vibration-resistant granite surface plate to ensure that it maintains its measurement reliability over extended use. Used in conjunction with the measurement support software and digital camera, the microscope combines simple operation with the ability to perform accurate measurements of complex shapes.

*This product is not available in Europe.

● Main Features

1. Efficient inspection with a large square stage
2. Microscope frame has highly durable and vibration-resistant granite surface plate for precise and stable measurement
3. Used in conjunction with the measurement support software and digital camera, even complex shapes can be measured accurately using simple operations

● Launch Background

There has been growing demand in recent years from applications in manufacturing and assembly. Along with conventional uses for the measurement of machined parts, this demand is also for measurements on the semiconductor microelectronic devices and precision components used in mobile digital devices, or for assessing how well parts are aligned. Combining the functions of a metallurgical microscope and measuring instrument, measuring microscopes can be used as standalone instruments for performing accurate measurements and this has led to their use in a diverse range of inspection work.

By releasing STM7 as the successor to the STM6 (launched in March 2001), Olympus is seeking to further improve the efficiency of inspection work in manufacturing and assembly.

●Details of Main Features

1. Efficient inspection with a large square stage
   The STM7 comes with a large 300 mm× 300 mm square stage (platform for holding the sample to be inspected or measured) that has been adopted in place of the previous 250 mm × 150 mm stage. This makes it possible to measure large samples such as printed circuit boards or 300 mm semiconductor wafers without having to shift the orientation. The large stage also improves productivity by allowing a number of small samples to be placed on the stage at the same time.
2. Microscope frame has highly durable and vibration-resistant granite surface plate for precise and stable measurement
   To be able to measure part sizes or assembly precision with resolution of 0.1µm, the measuring microscope must be stable and resistant to vibration. The frame of the STM7 includes a highly rigid and vibration-resistant granite surface plate for more precise and reliable measurement.
3. Used in conjunction with the measurement support software and digital camera, even complex shapes can be measured accurately using simple operations
   When used with the STM7-BSW measurement support software and an Olympus microscope digital camera, the STM-7 can perform accurate measurements of more complex shapes while keeping the operation simple. Exporting measurement results to Microsoft Excel is also easily achieved, facilitating report generation.

●Main Specifications

* When using the large frame STM7-LF/STM7-LFA, a specimen whose height is 100 mm or less can be placed at the position backward from the light axis by 180 mm or more.

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